Crystallite Size Measurement Using X- Ray Diffraction
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چکیده
Mike Meier University of California, Davis September 13, 2004 Figure 1. FEG-SEM image of nanosized aluminum oxide powder. Note the magnification and the size of the micron bar. Also note how the smaller particles and the edges of the larger particles appear to be somewhat transparent. This is because much of the 5 kV electron beam can pass through these thinner parts of the particles. CRYSTALLITE SIZE MEASUREMENT USING XRAY DIFFRACTION
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